Wide-band measurement of complex permittivity using an overmoded circular cavity

Measurement Science and Technology

Volumn 19, Issue 2, 2008, Pages

  Shan, Xiaoyong ^a   Shen, Zhongxiang ^a   Tsuno, Takashi ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

Dielectric constant measurement; Mode matching method; Overmoded circular cavity

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; ERROR ANALYSIS; RESONANCE; SCATTERING PARAMETERS;

DIELECTRIC CONSTANT MEASUREMENT; MODE-MATCHING METHOD; OVERMODED CIRCULAR CAVITY;

PERMITTIVITY;

ALGORITHMS; DIELECTRIC MATERIALS; ERROR ANALYSIS; PERMITTIVITY; RESONANCE; SCATTERING PARAMETERS;

EID: 42549128753     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/2/025702     Document Type: Article

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