A novel design for electric field deflectometry on extended molecular beams

Measurement Science and Technology

Volumn 19, Issue 5, 2008, Pages

  Stefanov, André ^a,c   Berninger, Martin ^b,d   Arndt, Markus ^b  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

^c UNIVERSITY OF BRISTOL   (United Kingdom)

^d UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

Deflectometry; Polarizability measurement

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; OPTIMIZATION; POLARIZATION;

DEFLECTOMETRY; FORCE FIELD; POLARIZABILITY MEASUREMENT;

MOLECULAR BEAMS;

ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; MOLECULAR BEAMS; OPTIMIZATION; POLARIZATION;

EID: 42549127700     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/5/055801     Document Type: Article

References (37)