Defect structure of highly Zn-doped LiNb O3 single crystal revealed by extended x-ray absorption spectra

Applied Physics Letters

Volumn 92, Issue 16, 2008, Pages

  Tsai, P C ^a   Sun, M L ^a   Chia, C T ^a   Lu, H F ^b   Lin, S H ^c   Hu, M L ^d   Lee, J F ^e  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b INSTITUTE OF CHEMISTRY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^d Tera Xtal Technology Corporation   (Taiwan)

^e National Synchrotron Radiation Reserch Center   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); DEFECT STRUCTURES; DOPING (ADDITIVES); LITHIUM COMPOUNDS; X RAY ABSORPTION SPECTROSCOPY; ZINC;

CHARGED VACANCY; SCATTERING AMPLITUDES;

SINGLE CRYSTALS;

EID: 42549111649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913012     Document Type: Article

References (23)

1. Infrared Holography for Optical Communications, edited by, P. Boffi, D. Piccinin, and, M. C. Ubaldi, (Springer, Berlin, 2003).
2. T. Volk, B. Maximov, and S. Sulyanov, Opt. Mater. (Amsterdam, Neth.) 23, 229 (2003).
3. S. Sulyanov, B. Maximov, and T. Volk, Appl. Phys. A 74, S1031 (2002).
4. T. R. Volk, B. Maximov, T. Chernaya, N. Rubinina, M. Wöhlecke, and V. Simonov, Appl. Phys. B: Lasers Opt. 72, 647 (2001).
5. D. Xue and K. Kitamura, J. Cryst. Growth 249, 507 (2003).
6. M.-L. Hu, C.-T. Chia, J. Y. Chang, W.-S. Tse, and J.-T. Yu, Mater. Chem. Phys. 78, 358 (2002).
7. N. Iyi, K. Kitamura, F. Izumi, J. K. Yamamoto, T. Hayashi, H. Asano, and S. Kimura, J. Solid State Chem. 101, 340 (1992).
8. F. Abdi, M. Aillerie, M. Fontana, P. Bourson, T. Volk, B. Maximov, S. Sulyanov, N. Rubinina, and M. Wöhlecke, Appl. Phys. B: Lasers Opt. 68, 795 (1999).
9. T. S. Chernaya, B. A. Maksimov, T. R. Volk, N. M. Rubinina, and V. I. Simonov, JETP Lett. 73, 103 (2001).
10. C.-T. Chia, C.-C. Lee, and P.-J. Chang, Appl. Phys. Lett. 86, 182901 (2005).
11. L. Zhao, X. Wang, and B. Wang, Appl. Phys. B: Lasers Opt. 78, 769 (2004).
12. D. Xue and X. He, Phys. Rev. B 73, 064113 (2006).
13. C. Prieto and C. Zaldo, J. Phys.: Condens. Matter 6, L677 (1994).
14. C. Prieto, C. Zaldo, H. Dexpert, and P. Fessler, J. Phys.: Condens. Matter 3, 4135 (1991).
15. J. L. Jackel, C. E. Rice, and J. J. Veselka, Appl. Phys. Lett. 41, 607 (1982).
16. J. Mustre de Leon, J. J. Rehr, and S. I. Zabinsky, Phys. Rev. B 44, 4146 (1991).
17. K. Singh and D. K. Bopardikar, Ferroelectrics 281, 61 (1984).
18. P.-C. Tsai, H.-F. Lu, P.-J. Chang, and C.-T. Chia, Jpn. J. Appl. Phys., Part 1 46, 7159 (2007).
19. T. S. Chernaya, B. A. Maksimov, T. R. Volk, N. M. Rubinina, and V. I. Simonov, JETP Lett. 73, 103 (2001).
20. B. Ravel and M. Newville, J. Synchrotron Radiat. 12, 537 (2005).
21. M. Newville, J. Synchrotron Radiat. 8, 322 (2001).
22. E. A. Stern and S. M. Heald, Principles and Applications of EXAFS, Handbook of Synchrotron Radiation (North-Holland, Amsterdom, 1983) pp. 995-1014.
23. D. C. Koningsberger and R. Prins, X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES (Wiley, New York, 1988).