Study on EM environment of UHV test line segment

Gaodianya Jishu/High Voltage Engineering

Volumn 34, Issue 3, 2008, Pages 438-441

  Zhang, Guang Zhou ^a   Cheng, Geng Sheng ^b   Wan, Bao Quan ^a   Lu, Yao ^a   Wu, Xiong ^a   Zhang, Xiao Wu ^a  

^a Wuhan High Voltage Research Institute   (China)

^b National Grid Construction CoLtd   (China)

Author keywords

Audible noise (AN); EM environment; Power frequency electric field; Radio interference (RI); Test line segment; UHV

Indexed keywords

EID: 42549097443     PISSN: 10036520     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)