Self-testing of universal and fault-tolerant sets of quantum gates

SIAM Journal on Computing

Volumn 37, Issue 2, 2007, Pages 611-629

  Van Dam, Wim ^a   Magniez, Frédéric ^b   Mosca, Michele ^c   Santha, Miklos ^b  

^a University of California   (United States)

^b CNRS   (France)

^c UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Fault tolerance; Quantum circuit; Robustness; Self testing

Indexed keywords

COMPUTABILITY AND DECIDABILITY; DECISION THEORY; FAULT TOLERANT COMPUTER SYSTEMS; ITERATIVE METHODS; PROBABILITY; ROBUSTNESS (CONTROL SYSTEMS);

PROGRAM TESTING; QUANTUM CIRCUITS; QUANTUM GATES; SELF-TESTING;

QUANTUM COMPUTERS;

EID: 42549095580     PISSN: 00975397     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0097539702404377     Document Type: Article

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