ARXPS and high energy XPS characterisation of titanium surfaces for medical implants

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 751-753

  Sunding, Martin F ^a   Jensen, Ingvild T ^a   Stenstad, Per M ^a   Diplas, Spyros ^a,b  

^a SINTEF MATERIALS AND CHEMISTRY   (Norway)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

Angle resolved XPS; Auger parameter; Functionalisation; High energy XPS; Medical implant; Titanium surface

Indexed keywords

AUGER PARAMETERS; FUNCTIONALISATION; MEDICAL IMPLANTS; TITANIUM SURFACE;

EXCITATION ENERGY; SILICONES; X RAY PHOTOELECTRON SPECTROSCOPY;

IMPLANTS (SURGICAL);

EID: 42449094257     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2778     Document Type: Conference Paper

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