XPS characterization of a synthetic Ti-containing MFI zeolite framework: The titanosilicalites, TS-1

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 695-699

  Langerame, Fausto ^a   Salvi, Anna Maria ^a   Silletti, Marcello ^a   Moretti, Giuliano ^b  

^a UNIVERSITY OF BASILICATA   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

MFI type zeolite; Ti containing catalysts; XPS and XAES characterization

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; MESOPOROUS MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

QUANTOMECHANICAL CALCULATIONS; TITANOSILICALITES;

ZEOLITES;

EID: 42449084647     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2739     Document Type: Conference Paper

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