Critical exponents and scaling relations for self-organized critical phenomena

Physical Review Letters

Volumn 60, Issue 23, 1988, Pages 2347-2350

  Tang, Chao ^a,b   Bak, Per ^a,b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4244215017     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.60.2347     Document Type: Article

References (11)