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Volumn 59, Issue 4, 1999, Pages 2888-2893

Recombination dynamics in dry-etched (cd,zn)se/znse nanostructures: influence of exciton localization

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EID: 4244203557     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.2888     Document Type: Article
Times cited : (14)

References (32)
  • 10
    • 85037905326 scopus 로고    scopus 로고
    • H. Mariette, C. Gourgon, J. Cibert, Le Si Dang, C. Vieu, G. Brunthaler, H. Straub, W. Faschinger, N. Peleka, and W. W. Rühle, in, edited by B. Gil and R. L. Aulombard (World Scientific, Singapore, 1995), p. 383
    • H. Mariette, C. Gourgon, J. Cibert, Le Si Dang, C. Vieu, G. Brunthaler, H. Straub, W. Faschinger, N. Pelekanos, and W. W. Rühle, in Semiconductor Heteroexpitaxy: Growth, Characterization and Device Applications, edited by B. Gil and R. L. Aulombard (World Scientific, Singapore, 1995), p. 383.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.