Device-independent and standardless quantitative statement of elemental concentrations in non-thin targets by PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 197-202

  Potocek, Vaclav ^a,b   Toulhoat, Nelly ^a  

^a CEA SACLAY   (France)

^b CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; PARTICLE BEAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TARGETS;

PARTICLE INDUCED X RAY EMISSION (PIXE); SOFTWARE PACKAGE GUPIX;

X RAY ANALYSIS;

EID: 4244198329     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00905-1     Document Type: Article

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