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Volumn 62, Issue 1, 2000, Pages 119-122
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Measurements of critical-current diffraction patterns in annular Josephson junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4244168255
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.62.119 Document Type: Article |
Times cited : (7)
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References (15)
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