Fatigue behavior of Ti-Ni-Cu thin wires SME

Journal De Physique. IV : JP

Volumn 7, Issue 5, 1997, Pages

  De Araujo C J ^a,b   Morin, M ^a   Guenin G ^a  

^a CNRS   (France)

^b FEDERAL UNIVERSITY OF PARAÍBA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FATIGUE OF MATERIALS; MARTENSITIC TRANSFORMATIONS; SHAPE MEMORY EFFECT; STRESS ANALYSIS; TENSILE PROPERTIES; THERMAL CYCLING; TITANIUM ALLOYS;

STRESS ASSISTED TWO WAY MEMORY EFFECT (SATWME); THIN WIRES;

WIRE;

EID: 4244137198     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1997579     Document Type: Article

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