Improvement of the detection efficiency of channel plate electron multiplier for atom probe application

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 422-427

  Deconihout, B ^a   Gerard, P ^a   Bouet, M ^a   Bostel, A ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRIC FIELDS; ELECTRON EMISSION; EVAPORATION; IONS; PROBES; STATISTICS;

ATOM PROBE FIELD ION MICROSCOPY; DETECTION EFFICIENCY; INTERCHANNEL WEB; MICROCHANNEL PLATES; OPEN AREA RATIO;

ELECTRON MULTIPLIERS;

EID: 4244095763     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00405-X     Document Type: Article

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