Raman spectroscopy of germanium films deposited with cluster-beam technique

Physica B: Condensed Matter

Volumn 219-220, Issue 1-4, 1996, Pages 535-537

  Wakaki, M ^a   Iwase, M ^a   Show, Y ^a   Koyama, K ^a   Sato, S ^b   Nozaki, S ^b   Morisaki, H ^b  

^a TOKAI UNIVERSITY   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SEMICONDUCTING GERMANIUM; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; VIBRATIONS (MECHANICAL);

CLUSTER BEAM TECHNIQUE;

SEMICONDUCTING FILMS;

EID: 4244089094     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00803-9     Document Type: Article

References (6)

1. T. Arai, J. Spectrosc. Soc. Japan 23 (1984) 665.
2. S. Hayashi and K. Yamamoto, Phase Transitions 24 26 (1990) 641.
3. S. Sato, S. Nozaki, H. Morisaki and M. Iwase, Appl. Phys. Lett. 66 (1995) 3176.
4. R.J. Kobliska, S.A. Solin, M. Selders, R.K. Chang, R. Alben, M.F. Thorpe and D. Weaire, Phys. Rev. Lett. 29 (1972) 728.
5. F.P. Bundy and J.S. Jasper, Science 139 (1963) 340.
6. S. Nozaki, S. Sato, A. Denda, H. Ono and H. Morisaki, Mater. Res. Soc. Symp. Proc. 358 (1995).