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Volumn 57, Issue 6, 1986, Pages 755-758
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Transient analysis of ionic cluster emission from a silicon surface by nitrogen-laser excitation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4244062656
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.57.755 Document Type: Article |
Times cited : (7)
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References (8)
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