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Physical Review Letters

Volumn 35, Issue 20, 1975, Pages 1359-1362

Frequency dependence of the electron conductivity in the silicon inversion layer in the metallic and localized regimes

(3) Allen Jr , S J a Tsui, D C a DeRosa, F a

a LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4244046052 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.35.1359 Document Type: Article

Times cited : (105)

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