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Volumn 61, Issue 7, 2000, Pages 4667-4671
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Role of tight-binding parameters and scaling laws on effective charges in semiconductors
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Author keywords
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Indexed keywords
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EID: 4244028008
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.61.4667 Document Type: Article |
Times cited : (2)
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References (15)
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