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Volumn 37, Issue 34, 1998, Pages 8038-8042

Effects of space exposure on ion-beam-deposited silicon-carbide and boron-carbide coatings

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EID: 4244020940     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.008038     Document Type: Article
Times cited : (19)

References (13)
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  • 2
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    • R. A. M. Keski-Kuha, J. F. Osantowski, H. Herzig, J. S. Gum, and A. R. Toft, “Normal incidence reflectance of ion beam deposited SiC films in the EUV, ” Appl. Opt. 27, 2815-2816 (1988).
    • (1988) Appl. Opt. , vol.27 , pp. 2815-2816
    • Keski-Kuha, R.A.M.1    Osantowski, J.F.2    Herzig, H.3    Gum, J.S.4    Toft, A.R.5
  • 5
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    • Ion beam deposited boron carbide coatings for the EUV
    • G. M. Blumenstock and R. A. M. Keski-Kuha, “Ion beam deposited boron carbide coatings for the EUV, ” Appl. Opt. 33, 5962-5963 (1994).
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  • 6
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    • G. M. Blumenstock, R. A. M. Keski-Kuha, and M. L. Ginter, “Extreme ultraviolet properties of ion-beam-deposited boron carbide thin films, ” in X-Ray and Extreme Ultraviolet Optics, R. B. Hoover and A. B. C. Walker, eds., Proc. SPIE 2515, 558-564 (1995).
    • (1995) X-Ray and Extreme Ultraviolet Optics , pp. 558-564
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  • 8
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    • Scatter and roughness measurements on optical surfaces exposed to space
    • J. C. Stover, ed., Proc. SPIE 1530
    • D.-R. Schmitt, H. Swoboda, and H. Rosteck, “Scatter and roughness measurements on optical surfaces exposed to space, ” in Optical Scatter: Applications, Measurement, and Theory, J. C. Stover, ed., Proc. SPIE 1530, 104-110 (1991).
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.