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Volumn 241-243, Issue , 1997, Pages 216-218
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High-resolution neutron scattering with commercial thin silicon wafers as focusing monochromators
a a a a a |
Author keywords
Bent silicon wafers; Quasielastic neutron scattering; Three axis spectrometer
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Indexed keywords
FOCUSING;
MONOCHROMATORS;
NEUTRON DIFFRACTION;
NEUTRON SPECTROMETERS;
OPTICAL COLLIMATORS;
POWDERS;
SILICON WAFERS;
PYROLITIC GRAPHITE MONOCHROMATOR;
QUASIELASTIC SCATTERING MEASUREMENTS;
SOLLER COLLIMATORS;
NEUTRON SCATTERING;
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EID: 4243872461
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(97)00555-3 Document Type: Article |
Times cited : (3)
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References (4)
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