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Volumn 241-243, Issue , 1997, Pages 216-218

High-resolution neutron scattering with commercial thin silicon wafers as focusing monochromators

Author keywords

Bent silicon wafers; Quasielastic neutron scattering; Three axis spectrometer

Indexed keywords

FOCUSING; MONOCHROMATORS; NEUTRON DIFFRACTION; NEUTRON SPECTROMETERS; OPTICAL COLLIMATORS; POWDERS; SILICON WAFERS;

EID: 4243872461     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(97)00555-3     Document Type: Article
Times cited : (3)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.