Ground-state roughness of the disordered substrate and flux line in d=2

Physical Review Letters

Volumn 77, Issue 15, 1996, Pages 3204-3207

  Zeng, Chen ^a   Middleton, A Alan ^a   Shapir, Y ^b  

^a SYRACUSE UNIVERSITY   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243872275     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.3204     Document Type: Article

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