Characterization of surface- and buried-channel detection transistors for CCD on-chip amplifiers

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 1997, Pages 193-196

  Centen, Peter G ^a   Roks, Edwin ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BURIED CHANNEL DETECTION NODE TRANSISTORS; SURFACE CHANNEL DETECTION NODE TRANSISTORS;

AMPLIFIERS (ELECTRONIC); BANDWIDTH; CAPACITANCE MEASUREMENT; CHARGE COUPLED DEVICES; DIFFUSION IN SOLIDS; ELECTRIC CURRENTS; HOT CARRIERS; SEMICONDUCTOR DEVICE MODELS; SHOT NOISE; SIGNAL TO NOISE RATIO; THERMAL NOISE;

MOSFET DEVICES;

EID: 4243831577     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)