Statistical characterization of simulated annealing applied to the x-ray phase problem

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 58, Issue 4, 1998, Pages 5131-5142

  Zimmer, Michael F ^a   Su, Wu Pei ^a  

^a University of Houston   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243820371     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.58.5131     Document Type: Article

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