A photoelectron-photoion coincidence method for the investigation of decay probabilities after innershell photoionization

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1477-1480

  Kanngiesser, B ^a   Brunken S ^a   Godehusen, K ^a   Gerth, Ch ^b   Malzer, W ^a   Richter, M ^c   Zimmermann, P ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b DESY   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

Core hole decay probabilities; K shell fluorescence yield of na

Indexed keywords

CHEMICAL ELEMENTS; FLUORESCENCE; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS;

CORE-HOLE DECAY; DECAY PROBABILITY; FLUORESCENCE YIELD; K-SHELL FLUORESCENCE YIELDS; LIGHT ELEMENTS; PHOTOELECTRON-PHOTOION COINCIDENCE; QUANTITATIVE INVESTIGATION; SODIUM ATOM;

PROBABILITY;

EID: 4243818701     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00725-2     Document Type: Article

References (5)

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5. B. Kanngießer, M. Jainz, S. Brünken, W. Benten, Ch. Gerth, K. Godehusen, K. Tiedtke, P. von Kampen, A. Tutay, P. Zimmermann, K.F. Demekhin, A.G. Kochur, Phys. Rev. A 62 (2000) 014702.