메뉴 건너뛰기




Volumn 123-124, Issue , 1998, Pages 11-16

Formation of the interface between c-Si(111) and diamond-like carbon studied with photoelectron spectroscopy

Author keywords

Band bending; Band offset; Photoelectron spectroscopy; Silicon carbon interface

Indexed keywords

AMORPHOUS FILMS; CARBON; DEPOSITION; ELECTRONIC PROPERTIES; FILM GROWTH; PASSIVATION; PHOTOELECTRON SPECTROSCOPY; PLASMA APPLICATIONS; SILICON; SILICON CARBIDE; STOICHIOMETRY; SUBSTRATES;

EID: 4243781936     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00497-2     Document Type: Article
Times cited : (10)

References (16)
  • 3
    • 0042217090 scopus 로고
    • J.J. Pouch (Ed.), Properties and Characterization of Amorphous Carbon Films, Transtech, Zürich
    • J. Robertson, in: J.J. Pouch (Ed.), Properties and Characterization of Amorphous Carbon Films, Mater. Sci. For. 52/53, Transtech, Zürich, 1990, p. 126.
    • (1990) Mater. Sci. For. , vol.52-53 , pp. 126
    • Robertson, J.1
  • 15
    • 0042217089 scopus 로고
    • PhD Thesis, Univ. Erlangen
    • T. Mandel, PhD Thesis, Univ. Erlangen, 1994.
    • (1994)
    • Mandel, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.