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Volumn 62, Issue 3, 2000, Pages 032102-032101

Influence of measurement on the lifetime and the linewidth of unstable systems

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); ELECTRON TUNNELING; EQUATIONS OF MOTION; FERMI LEVEL; LAPLACE TRANSFORMS; LINEAR EQUATIONS; PROBABILITY DISTRIBUTIONS; SEMICONDUCTOR QUANTUM DOTS;

EID: 4243778412     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (44)

References (36)
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    • Harris, R.A.1    Stodolsky, L.2
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    • (1991) Phys. Rev. A , vol.44 , pp. 1466
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  • 20
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    • R. A. Harris and L. Stodolsky, Phys. Lett. 116B, 464 (1982); E. Block and P. R. Berman, Phys. Rev. A 44, 1466 (1991); V. Frerichs and A. Schenzle, ibid. 44, 1962 (1991).
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    • and references therein
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    • Panov, A.D.1
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  • 32
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    • M. Field et al., Phys. Rev. Lett. 70, 1311 (1993); E. Buks, R. Shuster, M. Heiblum, D. Mahalu, and V. Umansky, Nature (London) 391, 871 (1998).
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  • 36
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    • In fact, the anti-Zeno effect has been discussed earlier in different publications, for instance, [9,10,20]
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    • Kaulakys, B.1    Gontis, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.