Interface roughness correlation in CdTe/CdZnTe strained quantum wells

Journal of Crystal Growth

Volumn 184-185, Issue , 1998, Pages 886-889

  Pelekanos, N T ^a   Boudet, N ^a   Eymery, J ^a   Mariette, H ^b  

^a CEA GRENOBLE   (France)

^b CNRS   (France)

Author keywords

Exciton linewidths; Interface roughness correlation; Strained heterostructures

Indexed keywords

EID: 4243766593     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)80185-1     Document Type: Article

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