SCOPUS 정보 검색 플랫폼

Volumn 281-282, Issue 1-2, 1996, Pages 80-83

In situ observation of the in-plane structure of C60 thin films on metal substrates prepared by molecular beam deposition

(3) Yoshida, Yuji a Tanigaki, Nobutaka a Yase, Kiyoshi a

a NATL INST OF MAT AND CHEM RES (Japan)

Author keywords

Carbon; Deposition process; X ray diffraction

Indexed keywords

CHARACTERIZATION; CRYSTAL ORIENTATION; DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; FILM PREPARATION; FULLERENES; METALS; SILVER; SUBSTRATES; SURFACE STRUCTURE; X RAY DIFFRACTION;

IN SITU OBSERVATION; MOLECULAR BEAM DEPOSITION; ORGANIC MOLECULAR BEAM DEPOSITION; TOTAL REFLECTION X RAY DIFFRACTION;

ULTRATHIN FILMS;

EID: 4243703831 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/0040-6090(96)08580-X Document Type: Article

Times cited : (15)

References (15)

1
- 0024606118
- M. Hara, H. Sasabe, A. Yamada and A.F. Garito, Jpn. J. Appl. Phys., 28 (1989) L306.
- (1989) Jpn. J. Appl. Phys. , vol.28
- Hara, M.¹ Sasabe, H.² Yamada, A.³ Garito, A.F.⁴

2
- 0024717006
- M. Mobus, M. Schreck and N. Karl, Thin Solid Films, 175 (1989) 89.
- (1989) Thin Solid Films , vol.175 , pp. 89
- Mobus, M.¹ Schreck, M.² Karl, N.³

3
- 0026107213
- H. Tada, K. Saiki and A. Koma, Jpn. J. Appl. Phys., 30 (1991) L306.
- (1991) Jpn. J. Appl. Phys. , vol.30
- Tada, H.¹ Saiki, K.² Koma, A.³

4
- 0028484882
- C.D. England, G.E. Collins, T.J. Schuerlein and N.R. Armstrong, Langmuir, 10 (1994) 2748.
- (1994) Langmuir , vol.10 , pp. 2748
- England, C.D.¹ Collins, G.E.² Schuerlein, T.J.³ Armstrong, N.R.⁴

5
- 0003965826
- Kluwer Academic Publishers
- K. Prassides, Physics and Chemistry of the Fullerenes Kluwer Academic Publishers, 1994, p. 63.
- (1994) Physics and Chemistry of the Fullerenes , pp. 63
- Prassides, K.¹

6
- 0000630652
- M. Sakurai, H. Tada, K. Saiki and A. Koma, Jpn. J. Appl. Phys., 30 (1991) L1892.
- (1991) Jpn. J. Appl. Phys. , vol.30
- Sakurai, M.¹ Tada, H.² Saiki, K.³ Koma, A.⁴

7
- 0027606630
- H.-G. Busmann, R. Hiss, H. Gaber and I.V. Hertel, Surf. Sci., 289 (1993) 381.
- (1993) Surf. Sci. , vol.289 , pp. 381
- Busmann, H.-G.¹ Hiss, R.² Gaber, H.³ Hertel, I.V.⁴

8
- 0041029114
- S. Folsh, T. Murano, A. Yamashita and T. Hayashi, Appl. Phys. Lett., 62 (1993) 2643.
- (1993) Appl. Phys. Lett. , vol.62 , pp. 2643
- Folsh, S.¹ Murano, T.² Yamashita, A.³ Hayashi, T.⁴

9
- 0029271716
- K. Tanigaki, S. Kuroshima and T.W. Ebbesen, Thin Solid Films, 257 (1995) 154.
- (1995) Thin Solid Films , vol.257 , pp. 154
- Tanigaki, K.¹ Kuroshima, S.² Ebbesen, T.W.³

10
- 0027064043
- E.I. Altman and R.J. Colton, Surf. Sci., 279 (1992) 49.
- (1992) Surf. Sci. , vol.279 , pp. 49
- Altman, E.I.¹ Colton, R.J.²

11
- 0027656501
- E.I. Altman and R.J. Colton, Surf. Sci., 295 (1993) 13.
- (1993) Surf. Sci. , vol.295 , pp. 13
- Altman, E.I.¹ Colton, R.J.²

12
- 30244514321
- T. David, J.K. Gimzewski, D. Purdie, B. Reihl and R.R. Schlittler, Phys. Rev., B50 (1994) 5810.
- (1994) Phys. Rev. , vol.B50 , pp. 5810
- David, T.¹ Gimzewski, J.K.² Purdie, D.³ Reihl, B.⁴ Schlittler, R.R.⁵

13
- 0029217261
- A. Fartash, Mar. Res. Soc. Symp. Proc., 359 (1995) 393.
- (1995) Mar. Res. Soc. Symp. Proc. , vol.359 , pp. 393
- Fartash, A.¹

14
- 0023452354
- T. Horiuchi, K. Fukao and K. Matsushige, Jpn. J. Appl. Phys., 26 (1987) L1839.
- (1987) Jpn. J. Appl. Phys. , vol.26
- Horiuchi, T.¹ Fukao, K.² Matsushige, K.³

15
- 0010693848
- K. Ishida, K. Hayashi, Y. Yoshida, T. Horiuchi and K. Matsushige, J. Appl. Phys., 73 (1993) 7338.
- (1993) J. Appl. Phys. , vol.73 , pp. 7338
- Ishida, K.¹ Hayashi, K.² Yoshida, Y.³ Horiuchi, T.⁴ Matsushige, K.⁵

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