Tracer diffusion of Ni and Ge in L12-type intermetallic compound Ni3Ge

Defect and Diffusion Forum

Volumn , Issue 194-199 PART 1, 2001, Pages 511-516

  Ikeda, T ^a   Nakajima, H ^a   Numakura, H ^b   Koiwa, M ^b  

^a OSAKA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Degree of Order; Intermetallic Compound; L12 Type Structure; Ni3ge; Tracer Diffusion

Indexed keywords

DIFFUSION; RADIOACTIVE TRACERS; SEMICONDUCTING INTERMETALLICS; STOICHIOMETRY;

TRACER DIFFUSION;

NICKEL COMPOUNDS;

EID: 4243696072     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.194-199.511     Document Type: Article

References (15)

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