메뉴 건너뛰기




Volumn 389-393, Issue , 2002, Pages 435-438

Structure of 2D-nucieation-lnduced stacking faults in 6H-SiC

Author keywords

2 D Nucleation; PVT; Stacking faults; TEM

Indexed keywords

NUCLEATION; SILICON CARBIDE; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 4243671065     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028hnnwscientific.net/MSF.389-393.435     Document Type: Conference Paper
Times cited : (4)

References (5)
  • 4
    • 84953329792 scopus 로고    scopus 로고
    • Ph. D. Thesis Dissertation for E. K. Sanchez.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.