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Volumn 66, Issue SUPPL. 1, 1998, Pages

Analysis of electrical breakdown failures bymeans of SFM-basedmethods

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN CHANNEL; BREAKDOWN CURRENTS; BREAKDOWN PHENOMENA; CORRELATED MATERIALS; DEVICE MODELS; ELECTRICAL BREAKDOWN; ELECTRICAL OVERSTRESS; FLOW CHANNELS; HIGH RESOLUTION; MATERIAL FLOW; MATERIAL TRANSPORT; PARALLEL DETECTION; PROTECTION STRUCTURE; SEM; SI DEVICES; SMALL FEATURES; TOPOGRAPHICAL INFORMATION; VERTICAL DIRECTION;

EID: 4243645705     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051298     Document Type: Article
Times cited : (3)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.