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Physical Review Letters

Volumn 73, Issue 13, 1994, Pages 1845-1848

Penetration depth measurements of 3D XY critical behavior in YBa2Cu3O6.95 crystals

(6) Kamal, S a Bonn, D A a Goldenfeld, Nigel b Hirschfeld, P J c Liang, Ruixing a Hardy, W N a

a UNIVERSITY OF BRITISH COLUMBIA (Canada)

b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

c UNIVERSITY OF FLORIDA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243629755 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.73.1845 Document Type: Article

Times cited : (206)

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