Ballistic-electron-emission microscopy of conduction-electron surface states

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 11, 2000, Pages 7161-7164

  Weilmeier, M ^a   Rippard, W ^a   Buhrman, R ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243581253     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.7161     Document Type: Article

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