Nano-fractographic estimation on the profiles and dimensions of fatigue striation

Key Engineering Materials

Volumn , Issue 187 PART 2, 2000, Pages 827-832

  Choi, S J ^a   Ishii, H ^b   Kwon, J D ^a  

^a Yeungnam University   (South Korea)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

AFM; Nano Fractography; Stress Ratio; Striation Height; Striation Width

Indexed keywords

EID: 4243535138     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

References (11)

1. For example, "Fractography and its application" (in Japanese) Edited by R. Koterazawa (1981), Nikkan Kogyo Shinbunsha.
2. K. Furukawa, Y. Murakami, S. Nishida, Int. J. Fatigue, 20, 509 (1998).
3. D. Sarid, Oxford Series on Optical Science, "Scanning Force Microscopy" (1991) Oxford University Press.
4. S. Chiang and R. J. Wilson, "Images of Materials", Edited by D.B. Wilson, A. R. Pelton and R. Grosky, p.241 (1991) Oxford University Press.
5. T. S. Sriram, M. E. Fine and Y. W. Chung, Acta Metall. Mater., 41, 2515 (1993).
6. Y. Nakai, S. Fukuhara, K. Ohnishi, "Proc. 73rd JSME Annual Meeting', II 418 (1996).
7. H. Masuda, N. Nagashima, S. Matsuoka, Trans. JSME, A-57, 541 (1991).
8. K. Komai, K. Minoshima and T. Miyawaki, Trans. JSME, A-62, 600 (1996).
9. S. Choi, H. Ishii and K. Tohgo, APCFS '96, 683 (1996).
10. Z. S. Basinski and S.J. Basinski, Acta Metall. Mater., 33, 1307 (1985).
11. J.R. Rice, ASTM STP, 415, 247 (1967)