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Volumn 109-110, Issue , 1996, Pages 206-208

Strong X-ray emission due to electrification

Author keywords

[No Author keywords available]

Indexed keywords

FLUORINE COMPOUNDS; ION BOMBARDMENT; PROTONS; SPECTRUM ANALYSIS; X RAYS;

EID: 4243403827     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00907-8     Document Type: Article
Times cited : (15)

References (15)
  • 4
    • 0041318268 scopus 로고    scopus 로고
    • Japanese Patent, Showa 49-4490 (1974)
    • M. Terasawa, Japanese Patent, Showa 49-4490 (1974).
    • Terasawa, M.1
  • 5
    • 0041318269 scopus 로고    scopus 로고
    • Japanese Patent, Showa 49-25072 (1974)
    • M. Terasawa, Japanese Patent, Showa 49-25072 (1974).
    • Terasawa, M.1
  • 6
    • 0042319821 scopus 로고    scopus 로고
    • Japanese Patent, Showa 49-29793 (1974)
    • I. Fujii and M. Terasawa, Japanese Patent, Showa 49-29793 (1974).
    • Fujii, I.1    Terasawa, M.2
  • 7
    • 0041318266 scopus 로고    scopus 로고
    • Japanese Patent, Showa 50-23995 (1975)
    • M. Terasawa and I. Fujii, Japanese Patent, Showa 50-23995 (1975).
    • Terasawa, M.1    Fujii, I.2
  • 11
    • 0041818932 scopus 로고    scopus 로고
    • Padua, Italy
    • K. Maeda et al., presented at PIXE-VII (Padua, Italy).
    • PIXE-VII
    • Maeda, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.