Calculation of the energy of extend defects in zinc by the semi-empirical tight-binding method

Materials Science Forum

Volumn 294-296, Issue , 1999, Pages 219-222

  Bere A ^a   Hairie, A ^a   Nouet, G ^a   Paumier, E ^a  

^a CNRS   (France)

Author keywords

Defect; Energy; Linear Scaling; Recursion; Tight Binding; Zinc

Indexed keywords

EID: 4243370404     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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