Two-dimensional positioning of the scanning tunneling microscope stage using a crystal as a scale reference

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Kawakatsu, H ^a   Hoshi, Y ^a   Bleuler, H ^a,b   Kougami, H ^a   Bossardt, M ^a   Vezzin, N ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE LATTICE; DIFFERENTIAL SIGNAL; DIGITAL INTEGRATOR; INCREMENTAL MOTION; LATERAL DRIFTS; METROLOGICAL APPLICATIONS; PIEZO ELEMENTS; POSITIONING CONTROL; SCANNING TUNNELING MICROSCOPES; SUBNANOMETERS; TUNNELING CURRENT; WEAK SIGNALS;

TWO DIMENSIONAL; WIND TUNNELS;

ATOMS;

EID: 4243336295     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051255     Document Type: Article

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