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Volumn 26, Issue 2, 1982, Pages 773-779

Magnetoresistance in Si metal-oxide-semiconductor field-effect transitors: Evidence of weak localization and correlation

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EID: 4243334108     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.26.773     Document Type: Article
Times cited : (180)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.