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Volumn 32, Issue 4, 1976, Pages 709-716
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Tieftemperatur-Raman-Messungen an rotierenden festen Proben
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4243314806
PISSN: 05848539
EISSN: None
Source Type: Journal
DOI: 10.1016/0584-8539(76)80138-9 Document Type: Article |
Times cited : (97)
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References (14)
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