Observation of different interfaces in silicon nitride by HRTEM. Influence of the microstructure on the creep properties

Key Engineering Materials

Volumn 132-136, Issue , 1997, Pages 559-562

  Bernard Granger, Guillaume ^a   Calès, Bernard ^a   Duclos, Richard ^b   Crampon, Jacques ^b  

^a Ctr Rech Norton Desmarquest F   (France)

^b UNIV LILLE   (France)

Author keywords

Creep; HRTEM; Silicon nitride

Indexed keywords

ADDITIVES; CERAMIC MATERIALS; CREEP; DENSIFICATION; INTERFACES (MATERIALS); MICROSTRUCTURE; MIXING; POWDERS; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

GAS PRESSURE SINTERING;

SILICON NITRIDE;

EID: 4243312602     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

References (9)

1. G. Bernard-Granger: Ph.D. Thesis in Materials Science, University of Lille - France, (1994)
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9. G. Bernard-Granger, J. Crampon, R. Duclos, B. Calès: to be published in J.Eur.Ceram.Soc.