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Volumn 66, Issue SUPPL. 1, 1998, Pages
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In situ atomic forcemicroscopy combined with a quartz-crystal microbalance study of Ag electrodeposition on Pt thin film
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Author keywords
[No Author keywords available]
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Indexed keywords
AQUEOUS SOLUTIONS;
COMPLEX MIXTURE;
ELECTROCHEMICAL REACTIONS;
ELECTROLYTIC SOLUTION;
FREQUENCY CHANGES;
IN-SITU;
IN-SITU OBSERVATIONS;
INTEGRATED CHARGE;
LARGE CRYSTAL;
LIQUID/SOLID INTERFACE;
MASS CHANGE;
MICROBALANCES;
NOVEL TECHNIQUES;
PLATINUM OXIDE;
PT FILMS;
PT THIN FILMS;
QUARTZ CRYSTAL RESONATOR;
RESONANCE FREQUENCIES;
TOPOGRAPHICAL IMAGES;
ATOMIC FORCE MICROSCOPY;
BEVERAGES;
CYCLIC VOLTAMMETRY;
ELECTRIC CURRENT MEASUREMENT;
ELECTRODEPOSITION;
OXIDE MINERALS;
PLATINUM;
PLATINUM COMPOUNDS;
QUARTZ;
RESONANCE;
RESONATORS;
SODIUM;
THIN FILM DEVICES;
THIN FILMS;
SILVER;
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EID: 4243305397
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051183 Document Type: Article |
Times cited : (10)
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References (19)
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