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Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 274-281

Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

(5) Ventrice Jr , C A a LaBella, V P a Ramaswamy, G a,b Yu, H P a Schowalter, L J a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

b INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ABSORPTION; ELECTRON EMISSION; ELECTRON SCATTERING; GOLD; INTERFACES (MATERIALS); THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTING SILICON;

EID: 4243303532 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(96)00215-2 Document Type: Article

Times cited : (9)

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