On the errors in molecular dipole moments derived from accurate diffraction data

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 5, 1999, Pages 965-967

  Coppens, Philip ^a   Volkov, Anatoliy ^a   Abramov, Yuriy ^a   Koritsanszky, Tibor ^b  

^a UNIVERSITY AT BUFFALO   (United States)

^b UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243302745     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767399009733     Document Type: Article

References (6)

1. Coppens, P. (1997). X-ray Charge Densities and Chemical Bonding. Oxford University Press.
2. Hamilton, W. C. (1964). Statistical Methods in the Physical Sciences. New York: Ronald Press.
3. Koritsanszky, T., Howard, S., Su, Z., Mallinson, P. R., Richter, T. & Hansen, N. K. (1997). XD. Computer Program Package for Multipole Refinement and Analysis of Electron Densities from Diffraction Data. Free University of Berlin, Germany.
4. Spackman, M. A. (1992). Chem. Rev. 92, 1769-1797.
5. Stewart, R. F. (1970). J. Chem. Phys. 53, 205-213.
6. Volkov, A., Wu, G. & Coppens, P. (1999). J. Synchrotron Rad. In the press.