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Volumn 109-110, Issue , 1996, Pages 63-70

Procedures of target preparation to improve PIXE efficiency in environmental research

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC AEROSOLS; ECOSYSTEMS; ENVIRONMENTAL ENGINEERING; SEDIMENTS; TARGETS; TRACE ELEMENTS; WATER ANALYSIS;

EID: 4243287275     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00888-8     Document Type: Article
Times cited : (10)

References (29)
  • 8
    • 0041821041 scopus 로고
    • Sample preparation techniques in trace elements analysis by X-ray emission spectroscopy
    • Vienna
    • V. Valkovic, Sample preparation techniques in trace elements analysis by X-ray emission spectroscopy, IAEA-TECDOC-300, Vienna (1983).
    • (1983) IAEA-TECDOC-300
    • Valkovic, V.1
  • 18
    • 84913329481 scopus 로고
    • eds. O. Meyer, G. Linker and O. Kappeler (Plenum, New York)
    • F. Folkmann, in: Ion Beam Surface Layer Analysis, eds. O. Meyer, G. Linker and O. Kappeler (Plenum, New York, 1976) p. 695.
    • (1976) Ion Beam Surface Layer Analysis , pp. 695
    • Folkmann, F.1
  • 19
    • 0041821040 scopus 로고
    • Thesis in Physics, University of Modena, Italy
    • V. Dallari, Thesis in Physics, University of Modena, Italy (1989).
    • (1989)
    • Dallari, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.