Model for macroscopic slits in 6H- and 4H-SiC single crystals

Materials Science Forum

Volumn 389-393, Issue 1, 2002, Pages 63-66

  Wollweber, J ^a   Rost, H J ^a   Schulz, D ^a   Siche, D ^a  

^a LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

BCF theory; Bulk crystals; Modified lely method; Polytype stability; Schwoebel effect; SiC; Slit defects; Step bunching

Indexed keywords

CRYSTAL GROWTH; INTERFACES (MATERIALS); SILICON CARBIDE; SLITTING; STABILITY; SINGLE CRYSTALS;

BULK CRYSTALS; MODIFIED LELY METHOD; POLYTYPE STABILITY; SCHWOEBEL EFFECTS; STEP BUNCHING; BCF THEORY; SCHWOEBEL EFFECT;

SINGLE CRYSTALS; SILICON CARBIDE;

EID: 4243266612     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.389-393.63     Document Type: Article

References (4)

1. B. van der Hoek, J. P. van der Eerden, P. Bennema, J. Crystal Growth 56 (1982) 108-124
2. H.-J. Rost, J. Doerschel, D. Schulz, D. Siche, J. Wollweber, Macrodefect generation in SiC single crystals caused by polytype changes, Proceedings ICSCRM 2001, Tsukuba-Japan, to be published
3. W. K. Burton, N. Cabrera, F. C. Frank, Phil. Trans. Roy. Soc. London 243 (1951) 299
4. R. L. Schwoebel, E. J. Shipsey, J. Appl. Phys. 37 (1966) 3682