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Volumn 67, Issue 9, 1996, Pages 3229-3237

Improved uniformity of multielement thin films prepared by off-axis pulsed laser deposition using a new heater design

Author keywords

[No Author keywords available]

Indexed keywords


EID: 4243192654     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147447     Document Type: Article
Times cited : (9)

References (18)
  • 6
    • 4243077388 scopus 로고
    • Ph.D. thesis, Stanford University. Stanford
    • D. G. Schlom, Ph.D. thesis, Stanford University. Stanford, 1990.
    • (1990)
    • Schlom, D.G.1
  • 9
    • 85033853631 scopus 로고    scopus 로고
    • We used commercially available sintered high-density SiC-10% Si disks
    • We used commercially available sintered high-density SiC-10% Si disks.
  • 11
    • 4243152797 scopus 로고
    • edited by D. B. Chrisey and G. K. Hubler Wiley, New York, Chap. 7 and references cited therein
    • K. L. Saenger in Pulsed Laser Deposition of Thin Films, edited by D. B. Chrisey and G. K. Hubler (Wiley, New York, 1994), Chap. 7 and references cited therein.
    • (1994) Pulsed Laser Deposition of Thin Films
    • Saenger, K.L.1
  • 15
    • 85033836583 scopus 로고    scopus 로고
    • note
    • Beside the pressure during the ablation process, the cosine power is dependent on the wavelength, fluence, and the target imprint area. Minor changes of these parameters in comparison to reported values, however, cannot explain the large variation of distributions found in the literature.
  • 16
    • 4243081947 scopus 로고
    • thesis, University Eindhoven
    • J. C. S. Kools, thesis, University Eindhoven, 1992.
    • (1992)
    • Kools, J.C.S.1
  • 17
    • 85033858711 scopus 로고    scopus 로고
    • note
    • The fact that the chemical composition is constant across 2 in. substrates (i.e., a uniform refractive index) validates the use of the optical scanning technique to monitor the relief map of films for the ellipticity analysis.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.