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Volumn 43, Issue 6 B, 2004, Pages

Energy distribution of ion-induced secondary electrons from MgO surface

Author keywords

Insulating films; Ion induced secondary electron emission; Ion solid interaction; Magnesium oxide; Surface potential

Indexed keywords

CONTAMINATION; DISPLAY DEVICES; ELECTRIC INSULATORS; ELECTRON EMISSION; INTERFACIAL ENERGY; PLASMAS; SURFACE PHENOMENA; THIN FILMS;

EID: 4243151723     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.43.l753     Document Type: Article
Times cited : (15)

References (26)
  • 20
    • 4243166545 scopus 로고
    • Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis and Microlithography, eds. J. Schou, P. Kruit and D. E. Newbury
    • W. O. Hofer: in Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis and Microlithography, eds. J. Schou, P. Kruit and D. E. Newbury (1990) Scanning Microscopy Suppl. 4.
    • (1990) Scanning Microscopy , Issue.SUPPL. 4
    • Hofer, W.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.