Thermoelectric properties of Fe2TiAl Heusler alloys

Journal of Alloys and Compounds

Volumn 377, Issue 1-2, 2004, Pages 38-42

  Suzuki, Ryosuke O ^a   Kyono, Takashi ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

Electronic band structure; Intermetallics; Thermoelectrics; X ray diffraction

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; FERMI LEVEL; IRON ALLOYS; SEEBECK EFFECT; SEMICONDUCTING ALUMINUM COMPOUNDS; THERMOELECTRICITY; TITANIUM ALLOYS; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ELECTRONIC BAND STRUCTURE; HEUSLER ALLOYS; PSEUDO GAP; THERMOELECTRICS;

INTERMETALLICS;

EID: 4243140452     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.01.035     Document Type: Article

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