An atomic-resolution atomic-force microscope implemented using an optical lever

Journal of Applied Physics

Volumn 65, Issue 1, 1989, Pages 164-167

  Alexander, S ^a   Hellemans, L ^a   Marti, O ^a   Schneir, J ^a   Elings, V ^a   Hansma, P K ^a   Longmire, Matt ^b   Gurley, John ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243137092     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.342563     Document Type: Article

References (39)