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Volumn 29, Issue 6, 1996, Pages 1580-1586
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Reduction of ion beam induced and atmospheric ageing of porous silicon using Al and SiO2 caps
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Author keywords
[No Author keywords available]
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Indexed keywords
AGING OF MATERIALS;
ALUMINUM;
AUGER ELECTRON SPECTROSCOPY;
CARBON;
CHEMICAL VAPOR DEPOSITION;
EVAPORATION;
ION BOMBARDMENT;
OPTICAL PROPERTIES;
OXYGEN;
POROUS SILICON;
SILICON COMPOUNDS;
SILICON WAFERS;
ATMOSPHERIC AGEING;
EVAPORATED ALUMINUM SURFACE CAPPING LAYERS;
MESOPOROUS MORPHOLOGY;
MICROPOROUS POROSITY;
PHOTO ILLUMINATION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
ION BEAMS;
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EID: 4243135186
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/29/6/025 Document Type: Article |
Times cited : (9)
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References (18)
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