The thickness dependence of the hopping time-of-flight current profiles in spatially non-uniform thin dielectric layers

Journal of Physics Condensed Matter

Volumn 8, Issue 12, 1996, Pages 2089-2093

  Rybicki, J ^a,b   Rybicka, A ^a,b   Feliziani, S ^a   Chybicki, M ^b  

^a UNIVERSITY OF CAMERINO   (Italy)

^b GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243123158     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/8/12/021     Document Type: Article

References (5)

1. Kao K C and Hwang W 1981 Electrical Transport in Solids (Oxford: Pergamon)
2. Leal Ferreira G F 1977 Phys. Rev. B 16 4719
3. Ries B and Bassler H 1987 Phys. Rev. B 35 2295
4. Rybicki J, Rybicka A, Mancini G, Feliziani S and Chybicki M 1995 J. Phys.: Condens. Matter 7 2987 (Erratum 1995 J. Phys.: Condens. Matter 7 5419)
5. Schonherr G, Bassler H and Silver M 1981 Phil. Mag. B 44 47